Center for Artificial Low Dimensional Electronic Systems

In-Plane dispersion of the quantum-well states of the epitaxial silver films on silicon

I. Matsuda, T.Ohta and H. W. Yeom [Physical Review B 65, 085327 (47 citations)(2002)]

Photoelectron spectroscopy study of Ag/Si(111)root 3X root 3 and the effect of additional Ag adatoms

R.I.G.Uhrberg, H.M.Zhang, T.Balasubreamainian, E.Landemark, and H. W. Yeom [Physical Review B 65, 081305(R) (43 citations)(2002)]

Automated angle-scanning photoemission spectroscopy system combined with molecular beam epitaxy at KeK-Pf BL-1C

. Ono, H. W. Yeom, K. Horiba, J.H. Oh, S. Nakazono, K. Nakamura, T. Mano, M. Mizuguchi, M. Oshima, Y. Aiura and A, Kakizaki [Nuclear Instruments & Methods in Physics Research Section A 467-468, 1497 (6 citations)(2001)]

Photoelectron diffraction study of the Si 2p surface-core-level-shift of the Si(001)(1x2)-Sb surface

M.Shimomura, T.abukawa, K.Yoshimura, J.H.Oh, H. W. Yeom, and S.Kono [Surface Science 493, 23 (3 citations)(2001)]

Angle-resolved photoemission study of the hydrogenated 3C-SiC(001)2x1-H surface

S. M. Widstrand, L. S. O. Johansson, K. O. Magnulsson, H. W. Yeom, S. Hara, and S. Yoshida [Surface Science 479, 247 (11 citations)(2001)]

Correspondence of experimental surface electronic structure of the Si(1 1 3)3×2 with structure models

K. S. An, C. C. Hwang, H. S. Kim, C. -Y. Park, I. Matsuda, H. W. Yeom, S. Suga and A. Kakizaki [Surface Science 478, 123-130 (6 citations)(2001)]

Chemical structure of the ultra-thin SiO2/Si(100) interface: angle resolved Si 2p photoemssion study

.H.Oh, H. W. Yeom, Y.Hagimoto, K.Ono, M.Oshima, N.Hirashita, M.Nywa, A.Toriumi and A.Kakizaki [Physical Review B 63, 205310 (103 citations)(2001)]

Growth and electronci quantization of metastable silver films on Si(001)

I.Matsuda, H. W. Yeom, K.Tono, T.Tanikawa, and T. ohta [Physical Review B 63, 125325 (33 citations)(2001)]