2018 |
Directly Assembled 3D Molybdenum Disulfide on Silicon Wafer for Efficient Photoelectrochemical Water Reduction Dinsefa Mensur Andoshe;Gangtae Jin;Chang-Soo Lee;Changyeon Kim;Ki Chang Kwon;Seokhoon Choi;Woonbae Sohn;Cheon Woo Moon;Seung Hee Lee;Jun Min Suh;Sungwoo Kang;Jaehyun Park;Hoseok Heo;Jong Kyu Kim;Seungwu Han;Moon-Ho Jo;Ho Won Jang [ADVANCED SUSTAINABLE SYSTEMS 2,3, 1700142-(2018)] Abstract |
2018 |
Highly efficient computer algorithm for identifying layer thickness of atomically thin 2D materials Jekwan Lee;Seungwan Cho;Soohyun Park;Hyemin Bae;Minji Noh;Beom Kim;Chihun In;Seunghoon Yang;Sooun Lee;Seung Young Seo;Jehyun Kim;Chul-Ho Lee;Woo-Young Shim;Moon-Ho Jo;Dohun Kim;Hyunyong Choi [Journal of Physics D: Applied Physics 51,11, 11LT03-(2018)] Abstract |
2018 |
Importance of the van Hove singularity in superconducting PdTe2 Kim K.;Kim S.;Kim J.S.;Kim H.;Park J.-H.;Min B.I. [Physical Review B 97, 16, 165102-(2018)] Abstract |
2018 |
Thickness driven spin reorientation transition of epitaxial LaCrO3 films Park J.;Kim D.-H.;Lee D.;Ko K.-T.;Hyun Song J.;Kim J.-Y.;Koo T.-Y.;Lee S.R.;Park J.-H. [Applied Physics Letters 112, 11, 112403-(2018)] Abstract |
2018 |
Ultrafast transient photocarrier dynamics of the bulk-insulating topological insulator B i1.5 S b0.5 T e1.7 S e1.3 Choi Y.G.;Zhung C.J.;Park S.-H.;Park J.;Kim J.S.;Kim S.;Park J.;Lee J.S. [Physical Review B 97, 7, 075307-(2018)] Abstract |
2018 |
Control over Electron-Phonon Interaction by Dirac Plasmon Engineering in the Bi2Se3 Topological Insulator In C.;Sim S.;Kim B.;Bae H.;Jung H.;Jang W.;Son M.;Moon J.;Salehi M.;Seo S.Y.;Soon A.;Ham M.-H.;Lee H.;Oh S.;Kim D.;Jo M.-H.;Choi H. [NANO LETTERS 18, 2, 734-739(2018)] Abstract |
2018 |
Spectroscopic, electronic and computational properties of a mixed tetrachalcogenafulvalene and its charge transfer complex Walwyn R.J.;Chan B.;Usov P.M.;Solomon M.B.;Duyker S.G.;Jiin Young Koo;Masaki Kawano;Turner P.;Kepert C.J.;D`Alessandro D.M. [Journal of Materials Chemistry C 6, 5, 1092-1104(2018)] Abstract |
2018 |
Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution Kim J.;Casa D.;Said A.;Krakora R.;Kim B.J.;Kasman E.;Huang X.;Gog T. [Scientific Reports 8, 1, 1958-(2018)] Abstract |